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Automated Test

NIDays 2016

Dans un monde où une technologie est dépassée par la prochaine avant même que la première n’ait épuisé le marché, les systèmes de mesure et de contrôle doivent déjà être utilisés à leur phase de développement et avant la création des premiers prototypes, afin d‘optimiser le processus sur toute la ligne. Ainsi, les systèmes devront être flexibles et modulables tout en restant extrêmement précis et hautement performants pour pouvoir réagir aux exigences des clients. L’utilisation d’une plate-forme matérielle et logicielle modulaire et d’une architecture ouverte constitue par conséquent la meilleure possibilité de parvenir au but plus rapidement, mais aussi d’une manière plus économique. Cette série de conférence illustre la facilité avec laquelle les systèmes de mesure peuvent être adaptés aux exigences croissantes.

 

 
11h00 – 11h45 Over 125 Years of Railway Technology and a Modern Test System
Christoph Märki, Zühlke Engineering AG
» Détails
11h45 – 12h30 Easily Expand Your Functional Test with In-Circuit Test … Based on Only one Platform !
Luca Bischof, ad+t AG
12h30 – 13h30 Pause de midi/visite de l’exposition
13h30 – 14h30 Keynote : Are we Seeing the End of Switzerland as a Location for Industry ?
14h30 – 14h45 Changement de salle
14h45 – 15h30 Introduction to PXI : A Modular Instrumentation Platform
National Instruments
» Détails
15h30 – 16h00 Pause café/visite de l’exposition
16h00 – 16h45 Big Data Analysis for Manufacturing Test
Vidar Gronas, Virinco
» Détails
16h45 – 17h30 Built for Speed : How to Optimize SMUs for High-Throughput Testing
National Instruments
» Détails
17h30 – 18h30 Apéro/visite de l’exposition

11h00 – 11h45
Over 125 Years of Railway Technology and a Modern Test System

Christoph Märki, Zühlke Engineering AG

To test the wiring and electrical functions of its rolling stock, RhB uses a robust automated test system. Designed and developed by Zühlke, the system increases the quality and speed of these tests, which are performed on various types of railcars. Based on TestStand, LabVIEW and PXI a system was created, which is used by RhB in several locations on a daily basis.

Retour à la session « Automated Test »

11h45 – 12h30
Easily Expand Your Functional Test with In-Circuit Test … Based on Only one Platform !

National Instruments

High-precision DC measurements frequently need a long measurement cycle to ensure proper signal integrity. However, many of these measurements are often unnecessarily throttled because of software overhead, long settling times, or inefficient measurement engine use. At this session, discover how to optimize source measure units (SMUs) for test throughput while maintaining an acceptable level of precision.

Retour à la session « Automated Test »

14h45 – 15h30
Introduction to PXI: A Modular Instrumentation Platform

National Instruments

Learn about PXI, a proven modular instrumentation platform that can keep up with your growing test, measurement, and control needs.

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16h00 – 16h45
Big Data Analysis for Manufacturing Test

Vidar Gronas, Virinco

Big data is a term that describes any voluminous amount of data that has the potential to be mined for information. Data stored in test systems is often overlooked and typically used retroactive to analyze problems that occurred. The presentation will show what you can find in the data by organizing and analyzing it. Potential problems can be identified and dealt with before it is too late.

Retour à la session « Automated Test »

16h45 – 17h30
Built for Speed: How to Optimize SMUs for High-Throughput Testing

National Instruments

High-precision DC measurements frequently need a long measurement cycle to ensure proper signal integrity. However, many of these measurements are often unnecessarily throttled because of software overhead, long settling times, or inefficient measurement engine use. At this session, discover how to optimize source measure units (SMUs) for test throughput while maintaining an acceptable level of precision.

Retour à la session « Automated Test »